Publications Repository - Helmholtz-Zentrum Dresden-Rossendorf

In-situ GIXRD characterization of the crystallization of Ni-Ti sputtered thin films

Martins, R. M. S.; Silva, R. J. C.; Braz Fernandes, F. M.; Pereira, L.; Gordo, P. R.; Maneira, M. J. P.; Schell, N.

• Lecture (Conference)
  2nd Int. Materials Symposium, 14.-16.04.2003, Campus da Caparica, Portugal

Permalink: https://www.hzdr.de/publications/Publ-9840