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Room-temperature, sorth-wavelength (400-500 nm) photoluminescence from silicon-implanted silicon dioxide films

Skorupa, W.; Yankov, R. A.; Tyschenko, I. E.; Fröb, H.; Böhme, T.; Leo, K.

• Applied Physics Letters 68 (1996) 17 pp. 2410-2412
  DOI: 10.1063/1.116150
  Cited 113 times in Scopus

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