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Formation of the phases Ti3Al and TiAl by high dose implantation of Aluminium into Titanium

Tsyganov, I. A.; Wieser, E.; Matz, W.; Mücklich, A.; Reuther, H.

Keywords: ion implantation; titanium; X-ray diffraction, TEM, AES

• Contribution to proceedings
  1st International Congress on Radiation Physics and Chemistry of Condensed Matter, High Current Electronics, and Modifikation of Materials with Particle Beams and Plasma Flows, Tomsk, Russia, Sept. 14 - 29, 2000

Permalink: https://www.hzdr.de/publications/Publ-3720