High precision X-ray polarimetry

Marx, B.; Schulze, K. S.; Uschmann, I.; Kämpfer, T.; Lötzsch, R.; Wehrhan, O.; Wagner, W.; Detlefs, C.; Roth, T.; Härtwig, J.; Förster, E.; Stöhlker, T.; Paulus, G. G.

doi:10.1103/PhysRevLett.110.254801

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High precision X-ray polarimetry

Marx, B.; Schulze, K. S.; Uschmann, I.; Kämpfer, T.; Lötzsch, R.; Wehrhan, O.; Wagner, W.; Detlefs, C.; Roth, T.; Härtwig, J.; Förster, E.; Stöhlker, T.; Paulus, G. G.

Abstract

The polarization purity of 6.457- and 12.914-keV X- rays has been improved to the level of 2.4E-10 and 5.7E-10. The polarizers are channel-cut silicon crystals using six 90° reflections. Their performance and possible applications are demonstrated in the measurement of the optical activity of a sucrose solution.

Keywords: X-ray polarimetry; diffraction; channel-cut silicon crystal

Physical Review Letters 110(2013), 254801-1-254801-4
DOI: 10.1103/PhysRevLett.110.254801
Cited 73 times in Scopus

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