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Synthesis and characterization of nickel cobalt oxide thin films

Calin, G.; Irimia, M.; Scarlat, C.; Purica, M.; Comanescu, F.; Iacomi, F.

Abstract

p-Type transparent and conductive cobalt–nickel oxide films of 130 nm thickness, have been deposited by spin coating method on glass substrates. The electrical and optical properties of the oxides have been studied as a function of the x=Co/(Co+Ni) ratio. A combination of x-ray diffraction, x-ray photoelectron spectroscopy and Raman spectroscopy was used in order to investigate thin film structures. Thin films of mixed oxides: NiCo2O4, Ni1.71 Co1.29 O4; NiO were obtained for x>0.60. The electrical conductivity of these films reaches a maximum conductivity at this stoichiometry.

Keywords: p-type TCO; structure; optical properties; electrical properties; Raman spectroscopy

  • Contribution to proceedings
    International Semiconductor Conference (CAS 2010), 11.-13.10.2010, Sinaia, Romania
    Semiconductor Conference (CAS), 2010 International, Sinaia, 978-1-4244-5783-0, 387-390

Permalink: https://www.hzdr.de/publications/Publ-15215


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