Setups - FWIZ-N
List of our setups for material modification(1), imaging(2), analytical methods(3) and preparation(4).
Modification
Instrument |
Functionality |
Contact |
OrsayFIB |
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OrsayFIB - Photo: Nico Klingner(5) |
HV-setup for focussed ion beams:
|
Nico Klingner(6) Lothar Bischoff(7) |
CANION FIB |
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CANION FIB - Photo: Nico Klingner(8) |
HV-setup for focussed ion beams:
|
Lothar Bischoff(9) Nico Klingner(10) |
Orion NanoFab |
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Orion NanoFab Photo: Gregor Hlawacek(11) |
Helium ion microscope:
|
Gregor Hlawacek(12) |
NVision 40 |
||
NVision 40 - Photo: Lothar Bischoff(13) |
HV-setup for focussed ion and electron beams:
|
Lothar Bischoff(14) |
Orion Plus |
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Orion Plus - Photo: Gregor Hlawacek(15) |
Helium ion microscope:
|
Gregor Hlawacek(16) |
HCI |
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HCI - Photo: Sascha Creutzburg |
UHV setup for highly charged ions:
|
René Heller(17) |
LEI |
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LEI Photo: Parminder Singh |
HV-setup for low energy ion irradiation:
|
Denise Erb(18) |
Imaging
Instrument |
Functionality |
Contact |
Olympus Ultra Objective |
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Olympus Ultra Objective Photo: Nico Klingner(19) |
Atomic force microscope:
|
Lothar Bischoff(20) |
Bruker Multimode 8 AFM |
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Bruker Multimode 8 AFM Photo: Parminder Singh |
Atomic force microscope:
|
Denise Erb(23) |
Omicron UHV AFM / STM |
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Omicron UHV AFM / STM Photo: Parminder Singh |
UHV atomic force / scanning transmission microscope:
|
Stefan Facsko(24) |
Orion NanoFab |
||
Orion NanoFab Photo: Gregor Hlawacek(25) |
Helium ion microscope:
|
Gregor Hlawacek(26) |
Orion Plus |
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Orion Plus - Photo: Gregor Hlawacek(27) |
Helium ion microscope:
|
Gregor Hlawacek(28) |
NVision 40 |
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NVision 40 - Photo: Lothar Bischoff(29) |
HV-setup for focussed ion beams and electron beams:
|
Lothar Bischoff(30) |
NanoSAM |
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NanoSAM - Photo: Denise Erb(31) |
UHV-setup for electron microscopy:
|
Denise Erb(32) |
Analytics
Instrument |
Functionality |
Contact |
TestFIB |
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TestFIB - Photo: Nico Klingner(33) |
UHV-setup for LMAIS (Liquid Metal Alloy Ion Sources) characterization:
|
Lothar Bischoff(34) Nico Klingner(35) |
NVision 40 |
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NVision 40 - Photo: Lothar Bischoff(36) |
HV-setup for focussed ion beams and electron beams:
|
Lothar Bischoff(37) |
Orion NanoFab |
||
Orion NanoFab Photo: Gregor Hlawacek(38) |
Helium ion microscope:
|
Gregor Hlawacek(39) |
HCI |
||
HCI - Photo: Sascha Creutzburg |
UHV setup for highly charged ions:
|
René Heller(40) |
NanoSAM |
||
NanoSAM - Photo: Denise Erb(41) |
UHV-setup for surface analytics:
|
Denise Erb(42) |
Preparation
Instrument |
Functionality |
Contact |
Spot Welder |
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Spot welder. Photo: Lothar Bischoff(43) |
Spot welding device:
|
Lothar Bischoff(44) Wolfgang Pilz |
Etching Setup |
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Etching setup - Photo: Nico Klingner(45) |
Etching setup:
|
Lothar Bischoff(46) Wolfgang Pilz Nico Klingner(47) |
Leica EM TXP |
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Leica EM TXP Photo: Nico Klingner(48) |
Mechanical preparation:
|
Nico Klingner(49) |
ArBlade 5000 CTC |
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ArBlade - Photo: Nico Klingner(50) |
HV-device for ion beam milling:
|
Nico Klingner(51) |
LMAIS Präparation |
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LMAIS Preparation Photo: Nico Klingner(52) |
HV-device for LMAIS (Liquid Metal Alloy Ion Sources) preparation:
|
Lothar Bischoff(53) Wolfgang Pilz Nico Klingner(54) |
Content from Sidebar
URL of this article
https://www.hzdr.de/db/Cms?pOid=61887