Publikationsrepositorium - Helmholtz-Zentrum Dresden-Rossendorf

Characterization of sputtered Shape Memory Alloy Ni-Ti films by cross-sectional TEM and SEM

Martins, R. M. S.; Mücklich, A.; Schell, N.; Silva, R. J. C.; Mahesh, K. K.; Braz Fernandes, F. M.

Keywords: shape memory alloy; Ni-Ti films TEM; SEM

• Poster
  INCOMAM’07 - International Conference on Microscopy and Microanalysis - XLII Congress of the Portuguese Microscopy Society, 06.-07.12.2007, Coimbra, Portugal
• Microscopy and Microanalysis 14(2008)supp 3, 85-86
  DOI: 10.1017/S1431927608089460

Permalink: https://www.hzdr.de/publications/Publ-10756