Title
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X-ray diffractometer at the Helmholtz Institute Freiberg for Resource Technology (HIF) at HZDR
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Description
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Analysis on the X-ray diffractometer for quantification of phases and materials in substances: Such analyses are required both in the exploration of new deposits and for the characterization of technological processes.
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Copyright
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HZDR/Frank Schinski
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Picture Id
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54409
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Date
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09.08.2016
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